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A preprint describes an error model based on read/write tests from a low-power ferroelectric RAM chip carried on a CubeSat in low Earth orbit. The authors say observed bit errors often formed regular spatial patterns, which their generative method learned.

Preliminary validation reports 0.92 precision for generated bit flips and 0.91 recall of observed flips. The authors also report a Wasserstein distance of 0.073 across 10,000 generated patterns. The paper presents a research model, not a radiation-qualified memory product.